Publication

Electron-Diffraction Analysis of the Ferroelectric Aluminate Sodalite Sr8[Al12o24](Cro4)2

Nava Setter
1991
Journal Articles

Abstract

The structures of the cubic, the tetragonal and the orthorhombic phases of single crystals of the ferroelectric aluminate sodalite Sr/sub 8/(Al/sub 12/O/sub 24/)(CrO/sub 4/)/sub 2/ were investigated by selected area and convergent beam electron diffraction in the temperature range between 180 and 370 K. Evidence was obtained for the non-centrosymmetric character of the cubic phase which infers the space group I43m. The electron diffraction analysis points to the following phases I43m, P4/sub 2//mmc and Ama2.

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https://infoscience.epfl.ch/entities/publication/14ebac57-2229-40e7-85c8-4c8ecfc6e297

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Nava Setter
1991
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/14ebac57-2229-40e7-85c8-4c8ecfc6e297

About this result

Related concepts (27)

Electron diffraction

Electron diffraction refers to changes in the direction of electron beams due to interactions with atoms. Close to the atoms the changes are described as Fresnel diffraction; far away they are called Fraunhofer diffraction. The resulting map of the directions of the electrons far from the sample (Fraunhofer diffraction) is called a diffraction pattern, see for instance Figure 1. These patterns are similar to x-ray and neutron diffraction patterns, and are used to study the atomic structure of gases, liquids, surfaces and bulk solids.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Related publications (14)

Electron-Diffraction Analysis of the Ferroelectric Aluminate Sodalite Sr8[Al12o24](Cro4)2

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