Publication

High-Resolution Tests of Low-Dimensionality Effects in Photoemission

Giorgio Margaritondo, László Forró, Helmuth Berger
1993
Journal Articles

Abstract

High-energy-resolution photoemission spectra, taken on three quasi-one-dimensional crystals, TaTe4, NbTe4, and (NbSe4)3I confirm the general phenomenon of the suppression of the photoemission intensity near the Fermi level in one dimension. We analyze the possible causes of this phenomenon in light of previous results on (TaSe4)2I.

Official source

https://infoscience.epfl.ch/entities/publication/0f6d2a81-49d0-49fa-8029-d8caa6af838d

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Giorgio Margaritondo, László Forró, Helmuth Berger
1993
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/0f6d2a81-49d0-49fa-8029-d8caa6af838d

About this result

Related concepts (12)

Photoemission spectroscopy

Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, XUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons.

Angle-resolved photoemission spectroscopy

Angle-resolved photoemission spectroscopy (ARPES) is an experimental technique used in condensed matter physics to probe the allowed energies and momenta of the electrons in a material, usually a crystalline solid. It is based on the photoelectric effect, in which an incoming photon of sufficient energy ejects an electron from the surface of a material. By directly measuring the kinetic energy and emission angle distributions of the emitted photoelectrons, the technique can map the electronic band structure and Fermi surfaces.

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Related publications (11)

High-Resolution Tests of Low-Dimensionality Effects in Photoemission

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