Publication

MEPHISTO spectromicroscope reaches 20 nm lateral resolution

Giorgio Margaritondo, Luca Perfetti
1999
Journal Articles

Abstract

The recently described tests of the synchrotron imaging photoelectron spectromicroscope MEPHISTO (Microscope a Emission de PHotoelectrons par Illumination Synchrotronique de Type Onduleur) were complemented by further resolution improvements and tests, which brought the lateral resolution down to 20 nm. Images and line plot profiles demonstrate such performance. (C) 1999 American Institute of Physics. [S0034-6748(99)04902-3].

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https://infoscience.epfl.ch/entities/publication/0a46601f-be3e-4f5f-bfc4-e1870fe5bb48

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Giorgio Margaritondo, Luca Perfetti
1999
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/0a46601f-be3e-4f5f-bfc4-e1870fe5bb48

About this result

Related concepts (9)

Super-resolution microscopy

Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.

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