Cell surface receptorCell surface receptors (membrane receptors, transmembrane receptors) are receptors that are embedded in the plasma membrane of cells. They act in cell signaling by receiving (binding to) extracellular molecules. They are specialized integral membrane proteins that allow communication between the cell and the extracellular space. The extracellular molecules may be hormones, neurotransmitters, cytokines, growth factors, cell adhesion molecules, or nutrients; they react with the receptor to induce changes in the metabolism and activity of a cell.
MicrofilamentMicrofilaments, also called actin filaments, are protein filaments in the cytoplasm of eukaryotic cells that form part of the cytoskeleton. They are primarily composed of polymers of actin, but are modified by and interact with numerous other proteins in the cell. Microfilaments are usually about 7 nm in diameter and made up of two strands of actin. Microfilament functions include cytokinesis, amoeboid movement, cell motility, changes in cell shape, endocytosis and exocytosis, cell contractility, and mechanical stability.
Lymph nodeA lymph node, or lymph gland, is a kidney-shaped organ of the lymphatic system and the adaptive immune system. A large number of lymph nodes are linked throughout the body by the lymphatic vessels. They are major sites of lymphocytes that include B and T cells. Lymph nodes are important for the proper functioning of the immune system, acting as filters for foreign particles including cancer cells, but have no detoxification function. In the lymphatic system a lymph node is a secondary lymphoid organ.
Beam (structure)A beam is a structural element that primarily resists loads applied laterally to the beam's axis (an element designed to carry primarily axial load would be a strut or column). Its mode of deflection is primarily by bending. The loads applied to the beam result in reaction forces at the beam's support points. The total effect of all the forces acting on the beam is to produce shear forces and bending moments within the beams, that in turn induce internal stresses, strains and deflections of the beam.
BucklingIn structural engineering, buckling is the sudden change in shape (deformation) of a structural component under load, such as the bowing of a column under compression or the wrinkling of a plate under shear. If a structure is subjected to a gradually increasing load, when the load reaches a critical level, a member may suddenly change shape and the structure and component is said to have buckled. Euler's critical load and Johnson's parabolic formula are used to determine the buckling stress of a column.
Algebraic structureIn mathematics, an algebraic structure consists of a nonempty set A (called the underlying set, carrier set or domain), a collection of operations on A (typically binary operations such as addition and multiplication), and a finite set of identities, known as axioms, that these operations must satisfy. An algebraic structure may be based on other algebraic structures with operations and axioms involving several structures.
I-beamI-beam is a generic lay term for a variety of structural members with an or -shaped cross-section. Technical terms for similar items include H-beam (for universal column, UC), w-beam (for "wide flange"), universal beam (UB), rolled steel joist (RSJ), or double-T (especially in Polish, Bulgarian, Spanish, Italian and German). I-beams are typically made of structural steel and serve a wide variety of construction uses. The horizontal elements of the are called flanges, and the vertical element is known as the "web".
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
