Publication

Measurements of local chemistry and structure in Ni(O)-YSZ composites during reduction using energy-filtered environmental TEM

Jan Van Herle, Cécile Hébert, Aïcha Hessler-Wyser, Quentin Thomas Jeangros
2014
Journal Articles

Abstract

Energy-filtered transmission electron microscopy images are acquired during the reduction of a NiO-YSZ composite in H-2 up to 600 degrees C. Temperature-resolved quantitative information about both chemistry and structure is extracted with nm spatial resolution from the data, paving the way for the development of detailed reduction models.

Official source

https://infoscience.epfl.ch/entities/publication/06289d16-fc50-4afd-ada6-9081e3426d8e

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Jan Van Herle, Cécile Hébert, Aïcha Hessler-Wyser, Quentin Thomas Jeangros
2014
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/06289d16-fc50-4afd-ada6-9081e3426d8e

About this result

Related concepts (14)

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Related publications (31)

Measurements of local chemistry and structure in Ni(O)-YSZ composites during reduction using energy-filtered environmental TEM

Graph Chatbot

Polydopamine-coated photoautotrophic bacteria for improving extracellular electron transfer in living photovoltaics

Microsecond Time-Resolved Cryo-Electron Microscopy

Electron-beam based nanoscale quantum controls