Publication

Study of probes and substrates for low temperature atomic force microscopy and biological applications

Giovanni Dietler
2003
Journal Articles

Abstract

The atomic force microscopy in ultrahigh vacuum and at low temperature demonstrated its excellent capability to reach atomic resolution. Nevertheless in the case of biological samples high resolution has been achieved only in very few cases. We demonstrated here the importance of the appropriate choice of probes and substrates in order to image DNA at low temperature with high resolution. We investigated properties of three types of cantilevers and they were studied by scanning electron microscopy as a function of temperature. A large bending of cantilevers, which were coated from both sides, was observed at low temperatures. Therefore uncoated cantilevers pare strongly recommended for low temperature applications. Different methods for immobilization of DNA on the substrate are examined at low temperatures. First images of linear DNA on graphite at 82 K under ultrahigh vacuum conditions are presented.

Official source

https://infoscience.epfl.ch/entities/publication/03457862-6b9f-43a4-a087-16b515a5d5d9

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Giovanni Dietler
2003
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/03457862-6b9f-43a4-a087-16b515a5d5d9

About this result

Related concepts (32)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Related publications (32)

Study of probes and substrates for low temperature atomic force microscopy and biological applications

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