Publications by Maja Dukic Pjanic

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Background: Focused electron beam induced deposition (FEBID) is a direct-writing technique with nanometer resolution, which has received strongly increasing attention within the last decade. In FEBID a precursor previously adsorbed on a substrate surface i ...

Atomic force microscope (AFM) is a tool that allows micro and nano scale imaging of samples ranging from solid state physics to biology. AFM uses mechanical forces to sense the sample and recreate a topography image with high spatial resolution. The bigges ...

The sensitivity and detection speed of cantilever-based mechanical sensors increases drastically through size reduction. The need for such increased performance for high-speed nanocharacterization and bio-sensing, drives their sub-micrometre miniaturizatio ...

Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback con ...

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the opt ...

Focused electron beam induced deposition (FEBID) has been demonstrated as a promising solution for synthesizing truly three-dimensional (3D) nanostructures. However, the lack of morphological feedback during growth complicates further development toward hi ...

Maja Dukic Pjanic

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Focused electron beam induced deposition: A perspective

Advances in self-sensing techniques for atomic force microscopy

Direct-write nanoscale printing of nanogranular tunnelling strain sensors for sub-micrometre cantilevers

Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Probing the Morphology and Evolving Dynamics of 3D Printed Nanostructures Using High-Speed Atomic Force Microscopy