Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.