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Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explores nanocrystal synthesis, focusing on nucleation and growth mechanisms, classical and non-classical theories, and chemical reaction mechanisms for metal oxides and semiconductors.
Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
