Lecture

Micro-laser materials processing: Light-Materials Interaction

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In course

MICRO-520: Laser microprocessing

The physical principles of laser light materials interactions are introduced with a large number of industrial application examples. Materials processing lasers are developing further and further, the lecture presents the physical limitations of the proces ...

Description

This lecture covers the interaction between light and materials in micro-laser processing, including topics such as fluorescein properties, luminescent lamp emissions, reflection coefficients, tissue ablation differences, scattering phenomena, effective medium approximation, multiphoton absorption, and localization of absorption.

Instructor

Patrik Willi Hoffmann

Expertise WettabilityMico-structuringElectron-beam DepositionPhotodepositionPhotoablationNano-optics Mission Patrik Hoffmann is heading the laboratory for Advanced Materials Processing at Empa. Laser materials processing including Additive Manufacturing are key topics in recent years.At the EPFL cite in the Laboratory for Optical Materials and Characterization LPMAT, novel functional material depositions by HV-CVD are studied. Recently BaTiO3 heteroepitaxial films have been grown on SrTiO3 buffered silicon

Official source

Related concepts (18)

Luminescence

Luminescence is the "spontaneous emission of radiation from an electronically excited species (or from a vibrationally excited species) not in thermal equilibrium with its environment", according to the IUPAC definition. A luminescent object is emitting "cold light", in contrast to "incandescence", where an object only emits light after heating. Generally, the emission of light is due to the movement of electrons between different energy levels within an atom after excitation by external factors.

Fresnel equations

The Fresnel equations (or Fresnel coefficients) describe the reflection and transmission of light (or electromagnetic radiation in general) when incident on an interface between different optical media. They were deduced by Augustin-Jean Fresnel (freɪˈnɛl) who was the first to understand that light is a transverse wave, even though no one realized that the "vibrations" of the wave were electric and magnetic fields.

Total internal reflection

In physics, total internal reflection (TIR) is the phenomenon in which waves arriving at the interface (boundary) from one medium to another (e.g., from water to air) are not refracted into the second ("external") medium, but completely reflected back into the first ("internal") medium. It occurs when the second medium has a higher wave speed (i.e., lower refractive index) than the first, and the waves are incident at a sufficiently oblique angle on the interface.

Reflection (physics)

Reflection is the change in direction of a wavefront at an interface between two different media so that the wavefront returns into the medium from which it originated. Common examples include the reflection of light, sound and water waves. The law of reflection says that for specular reflection (for example at a mirror) the angle at which the wave is incident on the surface equals the angle at which it is reflected. In acoustics, reflection causes echoes and is used in sonar. In geology, it is important in the study of seismic waves.

Reflection coefficient

In physics and electrical engineering the reflection coefficient is a parameter that describes how much of a wave is reflected by an impedance discontinuity in the transmission medium. It is equal to the ratio of the amplitude of the reflected wave to the incident wave, with each expressed as phasors. For example, it is used in optics to calculate the amount of light that is reflected from a surface with a different index of refraction, such as a glass surface, or in an electrical transmission line to calculate how much of the electromagnetic wave is reflected by an impedance discontinuity.

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