Tensor operatorIn pure and applied mathematics, quantum mechanics and computer graphics, a tensor operator generalizes the notion of operators which are scalars and vectors. A special class of these are spherical tensor operators which apply the notion of the spherical basis and spherical harmonics. The spherical basis closely relates to the description of angular momentum in quantum mechanics and spherical harmonic functions. The coordinate-free generalization of a tensor operator is known as a representation operator.
Finite fieldIn mathematics, a finite field or Galois field (so-named in honor of Évariste Galois) is a field that contains a finite number of elements. As with any field, a finite field is a set on which the operations of multiplication, addition, subtraction and division are defined and satisfy certain basic rules. The most common examples of finite fields are given by the integers mod p when p is a prime number. The order of a finite field is its number of elements, which is either a prime number or a prime power.
Field (mathematics)In mathematics, a field is a set on which addition, subtraction, multiplication, and division are defined and behave as the corresponding operations on rational and real numbers do. A field is thus a fundamental algebraic structure which is widely used in algebra, number theory, and many other areas of mathematics. The best known fields are the field of rational numbers, the field of real numbers and the field of complex numbers.
Curie temperatureIn physics and materials science, the Curie temperature (TC), or Curie point, is the temperature above which certain materials lose their permanent magnetic properties, which can (in most cases) be replaced by induced magnetism. The Curie temperature is named after Pierre Curie, who showed that magnetism was lost at a critical temperature. The force of magnetism is determined by the magnetic moment, a dipole moment within an atom which originates from the angular momentum and spin of electrons.
Free electron modelIn solid-state physics, the free electron model is a quantum mechanical model for the behaviour of charge carriers in a metallic solid. It was developed in 1927, principally by Arnold Sommerfeld, who combined the classical Drude model with quantum mechanical Fermi–Dirac statistics and hence it is also known as the Drude–Sommerfeld model.
Electron diffractionElectron diffraction refers to changes in the direction of electron beams due to interactions with atoms. Close to the atoms the changes are described as Fresnel diffraction; far away they are called Fraunhofer diffraction. The resulting map of the directions of the electrons far from the sample (Fraunhofer diffraction) is called a diffraction pattern, see for instance Figure 1. These patterns are similar to x-ray and neutron diffraction patterns, and are used to study the atomic structure of gases, liquids, surfaces and bulk solids.
Equal-area projectionIn cartography, an equivalent, authalic, or equal-area projection is a map projection that preserves relative area measure between any and all map regions. Equivalent projections are widely used for thematic maps showing scenario distribution such as population, farmland distribution, forested areas, and so forth, because an equal-area map does not change apparent density of the phenomenon being mapped. By Gauss's Theorema Egregium, an equal-area projection cannot be conformal.
Electron mobilityIn solid-state physics, the electron mobility characterises how quickly an electron can move through a metal or semiconductor when pulled by an electric field. There is an analogous quantity for holes, called hole mobility. The term carrier mobility refers in general to both electron and hole mobility. Electron and hole mobility are special cases of electrical mobility of charged particles in a fluid under an applied electric field. When an electric field E is applied across a piece of material, the electrons respond by moving with an average velocity called the drift velocity, .
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
