F-numberAn f-number is a measure of the light-gathering ability of any optical system like a camera lens or even the human eye. It is calculated by dividing the system's focal length by the diameter of the entrance pupil. The f-number is also known as the focal ratio, f-ratio, or f-stop, and it is key in determining the depth of field, rate of light scattering, and exposure of a photograph. The f-number is dimensionless that is usually expressed using a lower-case hooked f with the format N, where N is the f-number.
History of opticsOptics began with the development of lenses by the ancient Egyptians and Mesopotamians, followed by theories on light and vision developed by ancient Greek philosophers, and the development of geometrical optics in the Greco-Roman world. The word optics is derived from the Greek term τα ὀπτικά meaning 'appearance, look'. Optics was significantly reformed by the developments in the medieval Islamic world, such as the beginnings of physical and physiological optics, and then significantly advanced in early modern Europe, where diffractive optics began.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
MagnificationMagnification is the process of enlarging the apparent size, not physical size, of something. This enlargement is quantified by a size ratio called optical magnification. When this number is less than one, it refers to a reduction in size, sometimes called de-magnification. Typically, magnification is related to scaling up visuals or s to be able to see more detail, increasing resolution, using microscope, printing techniques, or digital processing. In all cases, the magnification of the image does not change the perspective of the image.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Tandem mass spectrometryTandem mass spectrometry, also known as MS/MS or MS2, is a technique in instrumental analysis where two or more mass analyzers are coupled together using an additional reaction step to increase their abilities to analyse chemical samples. A common use of tandem MS is the analysis of biomolecules, such as proteins and peptides. The molecules of a given sample are ionized and the first spectrometer (designated MS1) separates these ions by their mass-to-charge ratio (often given as m/z or m/Q).
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Resolution (mass spectrometry)In mass spectrometry, resolution is a measure of the ability to distinguish two peaks of slightly different mass-to-charge ratios ΔM, in a mass spectrum. There are two different definitions of resolution and resolving power in mass spectrometry. The IUPAC definition for resolution in mass spectrometry is Where a larger resolution indicates a better separation of peaks. This definition is used in a number of mass spectrometry texts. This use is also implied by the term "high-resolution mass spectrometry.
Super-resolution microscopySuper-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.
Oil immersionIn light microscopy, oil immersion is a technique used to increase the resolving power of a microscope. This is achieved by immersing both the objective lens and the specimen in a transparent oil of high refractive index, thereby increasing the numerical aperture of the objective lens. Without oil, light waves reflect off the slide specimen through the glass cover slip, through the air, and into the microscope lens (see the colored figure to the right).
LensA lens is a transmissive optical device that focuses or disperses a light beam by means of refraction. A simple lens consists of a single piece of transparent material, while a compound lens consists of several simple lenses (elements), usually arranged along a common axis. Lenses are made from materials such as glass or plastic and are ground, polished, or molded to the required shape. A lens can focus light to form an , unlike a prism, which refracts light without focusing.
Scanning transmission electron microscopyA scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.
