ScatteringScattering is a term used in physics to describe a wide range of physical processes where moving particles or radiation of some form, such as light or sound, are forced to deviate from a straight trajectory by localized non-uniformities (including particles and radiation) in the medium through which they pass. In conventional use, this also includes deviation of reflected radiation from the angle predicted by the law of reflection.
ProtonA proton is a stable subatomic particle, symbol _Proton, H+, or 1H+ with a positive electric charge of +1 e (elementary charge). Its mass is slightly less than that of a neutron and 1,836 times the mass of an electron (the proton-to-electron mass ratio). Protons and neutrons, each with masses of approximately one atomic mass unit, are jointly referred to as "nucleons" (particles present in atomic nuclei). One or more protons are present in the nucleus of every atom.
Rutherford scatteringIn particle physics, Rutherford scattering is the elastic scattering of charged particles by the Coulomb interaction. It is a physical phenomenon explained by Ernest Rutherford in 1911 that led to the development of the planetary Rutherford model of the atom and eventually the Bohr model. Rutherford scattering was first referred to as Coulomb scattering because it relies only upon the static electric (Coulomb) potential, and the minimum distance between particles is set entirely by this potential.
Elastic scatteringElastic scattering is a form of particle scattering in scattering theory, nuclear physics and particle physics. In this process, the kinetic energy of a particle is conserved in the center-of-mass frame, but its direction of propagation is modified (by interaction with other particles and/or potentials) meaning the two particles in the collision do not lose energy. Furthermore, while the particle's kinetic energy in the center-of-mass frame is constant, its energy in the lab frame is not.
Deep inelastic scatteringIn particle physics, deep inelastic scattering is the name given to a process used to probe the insides of hadrons (particularly the baryons, such as protons and neutrons), using electrons, muons and neutrinos. It was first attempted in the 1960s and 1970s and provided the first convincing evidence of the reality of quarks, which up until that point had been considered by many to be a purely mathematical phenomenon. It is an extension of Rutherford scattering to much higher energies of the scattering particle and thus to much finer resolution of the components of the nuclei.
Neutron scatteringNeutron scattering, the irregular dispersal of free neutrons by matter, can refer to either the naturally occurring physical process itself or to the man-made experimental techniques that use the natural process for investigating materials. The natural/physical phenomenon is of elemental importance in nuclear engineering and the nuclear sciences. Regarding the experimental technique, understanding and manipulating neutron scattering is fundamental to the applications used in crystallography, physics, physical chemistry, biophysics, and materials research.
Brillouin scatteringBrillouin scattering (also known as Brillouin light scattering or BLS), named after Léon Brillouin, refers to the interaction of light with the material waves in a medium (e.g. electrostriction and magnetostriction). It is mediated by the refractive index dependence on the material properties of the medium; as described in optics, the index of refraction of a transparent material changes under deformation (compression-distension or shear-skewing).
Rutherford backscattering spectrometryRutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high-energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions (typically protons or alpha particles) impinging on a sample. Geiger–Marsden experiment Rutherford backscattering spectrometry is named after Lord Rutherford, a physicist sometimes referred to as the father of nuclear physics.
Rutherford modelThe Rutherford model was devised by the New Zealand-born physicist Ernest Rutherford to describe an atom. Rutherford directed the Geiger–Marsden experiment in 1909, which suggested, upon Rutherford's 1911 analysis, that J. J. Thomson's plum pudding model of the atom was incorrect. Rutherford's new model for the atom, based on the experimental results, contained new features of a relatively high central charge concentrated into a very small volume in comparison to the rest of the atom and with this central volume containing most of the atom's mass.
ElectronThe electron (_Electron or _beta-) is a subatomic particle with a negative one elementary electric charge. Electrons belong to the first generation of the lepton particle family, and are generally thought to be elementary particles because they have no known components or substructure. The electron's mass is approximately 1/1836 that of the proton. Quantum mechanical properties of the electron include an intrinsic angular momentum (spin) of a half-integer value, expressed in units of the reduced Planck constant, ħ.
Ernest RutherfordErnest Rutherford, 1st Baron Rutherford of Nelson, (30 August 1871 – 19 October 1937) was a New Zealand physicist who was a pioneering researcher in both atomic and nuclear physics. Rutherford has been described as "the father of nuclear physics", and the greatest experimentalist "since Michael Faraday". In 1908, he was awarded the Nobel Prize in Chemistry "for his investigations into the disintegration of the elements, and the chemistry of radioactive substances.
Atomic form factorIn physics, the atomic form factor, or atomic scattering factor, is a measure of the scattering amplitude of a wave by an isolated atom. The atomic form factor depends on the type of scattering, which in turn depends on the nature of the incident radiation, typically X-ray, electron or neutron. The common feature of all form factors is that they involve a Fourier transform of a spatial density distribution of the scattering object from real space to momentum space (also known as reciprocal space).
X-ray scattering techniquesX-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
Form factor (design)Form factor is a hardware design aspect that defines and prescribes the size, shape, and other physical specifications of components, particularly in electronics. A form factor may represent a broad class of similarly sized components, or it may prescribe a specific standard. It may also define an entire system, as in a computer form factor. As electronic hardware has become smaller following Moore's law and related patterns, ever-smaller form factors have become feasible.
Proton decayIn particle physics, proton decay is a hypothetical form of particle decay in which the proton decays into lighter subatomic particles, such as a neutral pion and a positron. The proton decay hypothesis was first formulated by Andrei Sakharov in 1967. Despite significant experimental effort, proton decay has never been observed. If it does decay via a positron, the proton's half-life is constrained to be at least 1.67e34 years.
Small form factor (desktop and motherboard)Small form factor (abbreviated: SFF) is a term used for desktop computers and for some of its components, chassis and motherboard, to indicate that they are designed in accordance with one of several standardized computer form factors intended to minimize the volume and footprint of a desktop computer compared to the standard ATX form factor . For comparison purposes, the size of an SFF case is usually measured in litres. SFFs are available in a variety of sizes and shapes, including shoeboxes, cubes, and book-sized PCs.
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Electron diffractionElectron diffraction refers to changes in the direction of electron beams due to interactions with atoms. Close to the atoms the changes are described as Fresnel diffraction; far away they are called Fraunhofer diffraction. The resulting map of the directions of the electrons far from the sample (Fraunhofer diffraction) is called a diffraction pattern, see for instance Figure 1. These patterns are similar to x-ray and neutron diffraction patterns, and are used to study the atomic structure of gases, liquids, surfaces and bulk solids.
Compton scatteringCompton scattering (also called the Compton effect) discovered by Arthur Holly Compton, is the scattering of a high frequency photon after an interaction with a charged particle, usually an electron. It results in a decrease in energy (increase in wavelength) of the photon (which may be an X-ray or gamma ray photon), called the Compton effect. Part of the energy of the photon is transferred to the recoiling particle.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
