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Lecture

Synchrotrons and X-ray Techniques

Description

This lecture covers the principles and applications of synchrotrons, X-ray free-electron lasers, X-ray photoelectron spectroscopy (XPS), and X-ray photoelectron diffraction (XPD). It explains the experimental setup for XPS, including UHV sample environment and surface preparation, and discusses the qualitative angular scattering dependence in XPD. The instructor also presents examples of chemical shifts in XPS spectra and the complementary methods often used alongside XPS. The lecture concludes with a preview of the topics to be covered in the next video.

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Related concepts (14)

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Photoemission spectroscopy

Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, XUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons.

X-ray fluorescence

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.

Auger electron spectroscopy

Auger electron spectroscopy (AES; pronounced oʒe in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. It is a form of electron spectroscopy that relies on the Auger effect, based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The Auger effect was discovered independently by both Lise Meitner and Pierre Auger in the 1920s.

Ultraviolet photoelectron spectroscopy

Ultraviolet photoelectron spectroscopy (UPS) refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region. If Albert Einstein's photoelectric law is applied to a free molecule, the kinetic energy () of an emitted photoelectron is given by where h is Planck's constant, ν is the frequency of the ionizing light, and I is an ionization energy for the formation of a singly charged ion in either the ground state or an excited state.

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