AnnihilationIn particle physics, annihilation is the process that occurs when a subatomic particle collides with its respective antiparticle to produce other particles, such as an electron colliding with a positron to produce two photons. The total energy and momentum of the initial pair are conserved in the process and distributed among a set of other particles in the final state. Antiparticles have exactly opposite additive quantum numbers from particles, so the sums of all quantum numbers of such an original pair are zero.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
Angular resolutionAngular resolution describes the ability of any such as an optical or radio telescope, a microscope, a camera, or an eye, to distinguish small details of an object, thereby making it a major determinant of . It is used in optics applied to light waves, in antenna theory applied to radio waves, and in acoustics applied to sound waves. The colloquial use of the term "resolution" sometimes causes confusion; when an optical system is said to have a high resolution or high angular resolution, it means that the perceived distance, or actual angular distance, between resolved neighboring objects is small.
Creation and annihilation operatorsCreation operators and annihilation operators are mathematical operators that have widespread applications in quantum mechanics, notably in the study of quantum harmonic oscillators and many-particle systems. An annihilation operator (usually denoted ) lowers the number of particles in a given state by one. A creation operator (usually denoted ) increases the number of particles in a given state by one, and it is the adjoint of the annihilation operator.
Cluster decayCluster decay, also named heavy particle radioactivity, heavy ion radioactivity or heavy cluster decay, is a rare type of nuclear decay in which an atomic nucleus emits a small "cluster" of neutrons and protons, more than in an alpha particle, but less than a typical binary fission fragment. Ternary fission into three fragments also produces products in the cluster size. The loss of protons from the parent nucleus changes it to the nucleus of a different element, the daughter, with a mass number Ad = A − Ae and atomic number Zd = Z − Ze, where Ae = Ne + Ze.
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Positron emissionPositron emission, beta plus decay, or β+ decay is a subtype of radioactive decay called beta decay, in which a proton inside a radionuclide nucleus is converted into a neutron while releasing a positron and an electron neutrino (νe). Positron emission is mediated by the weak force. The positron is a type of beta particle (β+), the other beta particle being the electron (β−) emitted from the β− decay of a nucleus.
Electron diffractionElectron diffraction refers to changes in the direction of electron beams due to interactions with atoms. Close to the atoms the changes are described as Fresnel diffraction; far away they are called Fraunhofer diffraction. The resulting map of the directions of the electrons far from the sample (Fraunhofer diffraction) is called a diffraction pattern, see for instance Figure 1. These patterns are similar to x-ray and neutron diffraction patterns, and are used to study the atomic structure of gases, liquids, surfaces and bulk solids.
Electron captureElectron capture (K-electron capture, also K-capture, or L-electron capture, L-capture) is a process in which the proton-rich nucleus of an electrically neutral atom absorbs an inner atomic electron, usually from the K or L electron shells. This process thereby changes a nuclear proton to a neutron and simultaneously causes the emission of an electron neutrino. Proton + Electron → Neutron + Electron Neutrino or when written as a nuclear reaction equation, ^{0}{-1}e + ^{1}{1}p -> ^{1}{0}n + ^{0}{0} ν Since this single emitted neutrino carries the entire decay energy, it has this single characteristic energy.
Stable nuclideStable nuclides are nuclides that are not radioactive and so (unlike radionuclides) do not spontaneously undergo radioactive decay. When such nuclides are referred to in relation to specific elements, they are usually termed stable isotopes. The 80 elements with one or more stable isotopes comprise a total of 251 nuclides that have not been known to decay using current equipment (see list at the end of this article). Of these 80 elements, 26 have only one stable isotope; they are thus termed monoisotopic.
PhotonA photon () is an elementary particle that is a quantum of the electromagnetic field, including electromagnetic radiation such as light and radio waves, and the force carrier for the electromagnetic force. Photons are massless, so they always move at the speed of light in vacuum, 299792458m/s (or about ). The photon belongs to the class of boson particles. As with other elementary particles, photons are best explained by quantum mechanics and exhibit wave–particle duality, their behavior featuring properties of both waves and particles.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
