Lecture

Metrology Practicals: Introduction

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In course

MICRO-429: Metrology practicals

The student will get familiar with the techniques learnt in class (MICRO-428) and will put them to practice with experiments in the laboratory. There will be a practical training for each theme covered in class; the students will also learn good practices ...

Description

This lecture introduces the practical part of the MICRO-429 course, focusing on metrology experiments. Students will practice theoretical concepts, learn good measurement practices, and design experiments. Topics include quantum metrology, single-photon experiments, optical microscopy, and electron microscopy. The course structure involves 6 experiments in 4-hour time slots. Students will work with real instruments and even build a microscope. Key tasks include understanding SPADs, timing jitter measurements, and AFM for nanoscale measurements. The course also covers sensitivity in photon-counting devices, programming examples, and key instrumentation like the SPAD23 sensor, ps Laser Diode, and Integrating Sphere & Monochromator.

Instructors (3)

Claudio Bruschini

Claudio Bruschini holds an MSc in high energy physics from the University of Genova and a PhD in Applied Sciences from the Vrije Universiteit Brussel (VUB). He started his career with INFN (Italy, 1993), in the WA92 CERN collaboration (particle physics), and then moved to CERN as a Fellow in the European GP-MIMD2 project, attached to the NA48 collaboration (particle physics, parallel programming, 1994-1995). He then started his close collaboration with EPFL, first in the DeTeC (Demining Technology Center) project (sensors for landmine detection/humanitarian demining, 1996-1997). After DeTeC's end, he started the first of a series of fruitful collaborations with the Vrije Universiteit Brussel (VUB) on humanitarian demining related R&D (1998). This was followed by the EUDEM survey project (The European Union in Humanitarian Demining, 1998), the EUDEM2 three year EC sponsored support measure (www.eudem.info, 2001-2004), and the DELVE support action (www.delve.vub.ac.be, 2007). In parallel he started working within the EPFL's AQUA group (Advanced Quantum Architectures, Edoardo Charbon), on topics as diverse as ultrasonic sensors for in-air application, optical 3D and high speed 2D sensing, sensor networks, or tracking/motion capture systems, in particular for the preparation of research projects. This culminated in the European MEGAFRAME (www.megaframe.eu, FP6, 2006-2010, SPAD arrays and related in-pixel time stamping electronics in deep submicron CMOS technology) and SPADnet (www.spadnet.eu, FP7, 2010-2014, networked SPAD arrays for Positron Emission Tomography) projects, coordinated by EPFL-AQUA. As from 2009 he also worked with Dario Floreano on the management of the CURVACE Curved Artificial Compound Eyes FP7 project (www.curvace.org), coordinated by EPFL-LIS. He was also active with CHUV (Lausanne University Hospital) within EndoTOFPET-US (endoscopic PET) as well as on a CTI project devoted to the development of a new hand-held standalone tool for tracer-guided medical procedures. In 2014 he had also the pleasure of joining the EPFL ICLAB of Christian Enz during its ramp-up phase, collaborating on device related topics (SNF GigaRadMOST) and biomedical R&D (NanoTera WiseSkin). Claudio is now fully with EPFL’s Advanced Quantum Architecture (AQUA). He has also been active as independent scientific consultant, under the label CBR Scientific Consulting, on the preparation of (European) R&D project proposals and the execution of individual studies, and worked in 2006 for a local start-up as operations manager and R&D advisor.... but this is another story. An unauthorized early biography is available at http://lami.epfl.ch/team/claudiob/...

Official source

Related concepts (32)

Microscopy

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy. Optical microscopy and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the collection of the scattered radiation or another signal in order to create an image.

Super-resolution microscopy

Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.

Near-field scanning optical microscope

Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture.

Phase-contrast microscopy

NOTOC Phase-contrast microscopy (PCM) is an optical microscopy technique that converts phase shifts in light passing through a transparent specimen to brightness changes in the image. Phase shifts themselves are invisible, but become visible when shown as brightness variations. When light waves travel through a medium other than a vacuum, interaction with the medium causes the wave amplitude and phase to change in a manner dependent on properties of the medium.

Metrology

Metrology is the scientific study of measurement. It establishes a common understanding of units, crucial in linking human activities. Modern metrology has its roots in the French Revolution's political motivation to standardise units in France when a length standard taken from a natural source was proposed. This led to the creation of the decimal-based metric system in 1795, establishing a set of standards for other types of measurements.

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