Covers the principles and applications of plenoptic cameras and light field photography, including techniques for numerical refocusing and the evolution of camera technology.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Covers the rolling shutter effect and noise sources in CMOS cameras, highlighting solutions for image deformation and the advantages of pinned photodiodes.
Explores various microscopy detectors, their structures, and applications in digital imaging systems, emphasizing low-light imaging and CMOS technology advantages.
Provides an overview of light-matter interactions and their implications for optical detectors, including absorption, emission, and the characteristics of various semiconductor materials.