Lecture

Wavefront Sensor: Calibration and Measurement

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In course

MICRO-321: Optical engineering

Ce cours présente différentes facettes de l'optique moderne et met à la fois l'accent sur des bases rigoureuses et des applications pratiques. Le cours inclut une partie théorique avec un cours et des exercices, ainsi qu'une partie expérimentale avec des t ...

Description

This lecture covers the calibration and measurement process of a wavefront sensor, focusing on aligning the detector, adjusting intensity, and using software for automatic point identification. The instructor demonstrates how to achieve precise measurements and discusses the importance of stable settings and accurate calibration.

Instructors (2)

Karim Achouri

Teaching & PhD PhD Students Mahmoud Abouelatta, Hossein Allahverdizadeh, Mustafa Yücel Courses Applied Electromagnetics for Metamaterial Design MICRO-449 This course provides the students with the appropriate electromagnetics foundation to understand, model and design metamaterials, especially two-dimensional electromagnetic and optical structures such as metasurfaces. This course covers concepts that apply to both the microwave and optical regimes. Optical engineering (for MT) M

Olivier Martin

Olivier J.F. Martin received the M.Sc. and Ph.D. degrees in physics in 1989 and 1994, respectively, from the Swiss Federal Institute of Technology, Lausanne (EPFL), Switzerland. In 1989, he joined IBM Zurich Research Laboratory, where he investigated thermal and optical properties of semiconductor laser diodes. Between 1994 and 1997 he was a research staff member at the Swiss Federal Institute of Technology, Zurich (ETHZ). In 1997 he received a Lecturer fellowship from the Swiss National Science Foundation (SNSF). During the period 1996-1999, he spent a year and a half in the U.S.A., as invited scientist at the University of California in San Diego (UCSD). In 2001 he received a Professorship grant from the SNSF and became Professor of Nano-Optics at the ETHZ. In 2003, he was appointed Professor of Nanophotonics and Optical Signal Processing at the Swiss Federal Institute of Technology, Lausanne (EPFL), where he is currently head of the Nanophotonics and Metrology Laboratory and Director of the Microengineering Section.

Official source

Related concepts (4)

Unit of measurement

A unit of measurement is a definite magnitude of a quantity, defined and adopted by convention or by law, that is used as a standard for measurement of the same kind of quantity. Any other quantity of that kind can be expressed as a multiple of the unit of measurement. For example, a length is a physical quantity. The metre (symbol m) is a unit of length that represents a definite predetermined length. For instance, when referencing "10 metres" (or 10 m), what is actually meant is 10 times the definite predetermined length called "metre".

Calibration

In measurement technology and metrology, calibration is the comparison of measurement values delivered by a device under test with those of a calibration standard of known accuracy. Such a standard could be another measurement device of known accuracy, a device generating the quantity to be measured such as a voltage, a sound tone, or a physical artifact, such as a meter ruler.

System of units of measurement

A system of units of measurement, also known as a system of units or system of measurement, is a collection of units of measurement and rules relating them to each other. Systems of measurement have historically been important, regulated and defined for the purposes of science and commerce. Instances in use include the International System of Units or () (the modern form of the metric system), the British imperial system, and the United States customary system.

Metrology

Metrology is the scientific study of measurement. It establishes a common understanding of units, crucial in linking human activities. Modern metrology has its roots in the French Revolution's political motivation to standardise units in France when a length standard taken from a natural source was proposed. This led to the creation of the decimal-based metric system in 1795, establishing a set of standards for other types of measurements.

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