Lecture

Machine Learning Basics

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In course

CS-233(b): Introduction to machine learning (BA4)

Machine learning and data analysis are becoming increasingly central in many sciences and applications. In this course, fundamental principles and methods of machine learning will be introduced, analyzed and practically implemented. ...

Description

This lecture covers the fundamentals of machine learning, including the definition of machine learning, the difference between human and machine learning, supervised classification, labeled training sets, generic schemes, and applications in medical research, spam detection, and recommender systems. It also delves into topics such as nearest-neighbor classifiers, decision boundaries, training versus testing, polynomial curve fitting, underfitting, overfitting, and the importance of choosing the right k value in k-nearest-neighbor classifiers.

Instructor

Pascal Fua

Pascal Fua received an engineering degree from Ecole Polytechnique, Paris, in 1984 and the Ph.D. degree in Computer Science from the University of Orsay in 1989. He then worked at SRI International and INRIA Sophia-Antipolis as a Computer Scientist. He joined EPFL in 1996 where he is now a Professor in the School of Computer and Communication Science and heads the Computer Vision Laboratory. His research interests include shape modeling and motion recovery from images, analysis of microscopy images, and Augmented Reality. His research interests include shape modeling and motion recovery from images, analysis of microscopy images, and machine learning. He has (co)authored over 300 publications in refereed journals and conferences. He is an IEEE Fellow and has been an Associate Editor of IEEE journal Transactions for Pattern Analysis and Machine Intelligence. He often serves as program committee member, area chair, and program chair of major vision conferences and has cofounded three spinoff companies (Pix4D, PlayfulVision, and NeuralConcept).

Official source

Related concepts (32)

Overfitting

In mathematical modeling, overfitting is "the production of an analysis that corresponds too closely or exactly to a particular set of data, and may therefore fail to fit to additional data or predict future observations reliably". An overfitted model is a mathematical model that contains more parameters than can be justified by the data. In a mathematical sense, these parameters represent the degree of a polynomial. The essence of overfitting is to have unknowingly extracted some of the residual variation (i.

K-nearest neighbors algorithm

In statistics, the k-nearest neighbors algorithm (k-NN) is a non-parametric supervised learning method first developed by Evelyn Fix and Joseph Hodges in 1951, and later expanded by Thomas Cover. It is used for classification and regression. In both cases, the input consists of the k closest training examples in a data set. The output depends on whether k-NN is used for classification or regression: In k-NN classification, the output is a class membership.

Nearest neighbor search

Nearest neighbor search (NNS), as a form of proximity search, is the optimization problem of finding the point in a given set that is closest (or most similar) to a given point. Closeness is typically expressed in terms of a dissimilarity function: the less similar the objects, the larger the function values. Formally, the nearest-neighbor (NN) search problem is defined as follows: given a set S of points in a space M and a query point q ∈ M, find the closest point in S to q. Donald Knuth in vol.

Supervised learning

Supervised learning (SL) is a paradigm in machine learning where input objects (for example, a vector of predictor variables) and a desired output value (also known as human-labeled supervisory signal) train a model. The training data is processed, building a function that maps new data on expected output values. An optimal scenario will allow for the algorithm to correctly determine output values for unseen instances. This requires the learning algorithm to generalize from the training data to unseen situations in a "reasonable" way (see inductive bias).

Bias–variance tradeoff

In statistics and machine learning, the bias–variance tradeoff is the property of a model that the variance of the parameter estimated across samples can be reduced by increasing the bias in the estimated parameters. The bias–variance dilemma or bias–variance problem is the conflict in trying to simultaneously minimize these two sources of error that prevent supervised learning algorithms from generalizing beyond their training set: The bias error is an error from erroneous assumptions in the learning algorithm.

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