Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Explores deformation and rupture of materials at low temperature, focusing on crystallographic relationships, mechanical twins, and twinning mechanisms.
