Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
