Home

Concept

Kelvin probe force microscope

Applied sciences
Chemical engineering
Nanotechnology
Topics in nanotechnology

About
Privacy
Disclaimer

Graph Chatbot

Related publications (32)

Page 2 of 2

Volcano-Shaped Scanning Probe Microscopy Probe for Combined Force-Electrogram Recordings from Excitable Cells

Philippe Renaud, Arnaud Bertsch, Georg Fantner, Mélanie Thérèse Marie Hannebelle, Benoît Xavier Emmanuel Desbiolles

Atomic force microscopy based approaches have led to remarkable advances in the field of mechanobiology. However, linking the mechanical cues to biological responses requires complementary techniques capable of recording these physiological characteristics ...

AMER CHEMICAL SOC2020

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

Georg Fantner, Santiago Harald Andany, Charlène Cécile Geneviève Brillard

In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...

BEILSTEIN-INSTITUT2020

Nanoscale Characterization of Amyloid Fibrils and Biomacromolecules by Atomic Force Microscopy Approaches

Jiangtao Zhou

This thesis focuses on the interdisciplinary biophysical research field, in which physical approaches are applied to study the biological phenomena. Specifically, the main object of the research in this thesis is to target biological species,especially the ...

EPFL2020

Magnon Modes of Microstates and Microwave-Induced Avalanche in Kagome Artificial Spin Ice with Topological Defects

Dirk Grundler, Vinayak Shantaram Bhat

We investigate spin dynamics of microstates in artificial spin ice (ASI) in Ni81Fe19 nanomagnets arranged in an interconnected kagome lattice using microfocus Brillouin light scattering, broadband ferromagnetic resonance, magnetic force microscopy, x-ray p ...

2020

Holographic reconstruction of interlayer distance of bilayer two-dimensional crystal samples from their convergent beam electron diffraction patterns

Tatiana Latychevskaia

Convergent beam electron diffraction (CBED) patterns of twisted bilayer samples exhibit interference patterns in their CBED spots. Such interference patterns can be treated as off-axis holograms and the phase of the scattered waves, and hence the interlaye ...

2020

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...

AMER CHEMICAL SOC2019

A Large Range of Motion 3D MEMS Scanner With Five Degrees of Freedom

Matthias Imboden

Here, we discuss a novel, mixed mode 3D XYZ scanner built within a single foundry process. The device has a large range of motion in X, Y, and Z (14.1 mu m in X and Y and 97.9 mu m in Z) and can also rotate about two axes (7.4 degrees), making it a 5 degre ...

Institute of Electrical and Electronics Engineers2019

A novel microfabrication platform for hybrid multilayer MEMS

Nahid Hosseini

In Atomic force microscopy (AFM), the tip-sample interaction force can be measured through two primary detection techniques: optical beam detection (OBD) and electrical (self-sensing) readout. Compared to the optical method, the convenience of the self-sen ...

EPFL2019

Adjustable potential probes for band-gap predictions of extended systems through nonempirical hybrid functionals

Alfredo Pasquarello, Igor Reshetnyak, Thomas Bischoff

We describe a nonempirical procedure for achieving accurate band gaps of extended systems through the insertion of suitably defined potential probes. By enforcing Koopmans' condition on the resulting localized electronic states, we determine the optimal fr ...

2019

Scanning near-field optical microscopy with new probes and feedback modes

Anton Smirnov

Scanning Near-field Optical Microscopy (SNOM) technique enables to overcome Abbe diffraction limit of far-field optics as well as to obtain simultaneously optical and topographical images. While the optical resolution of the method is limited by the apertu ...

EPFL2019

Ferroelectric Self-Poling in GeTe Films and Crystals

Jan Hugo Dil

Ferroelectric materials are used in actuators or sensors because of their non-volatile macroscopic electric polarization. GeTe is the simplest known diatomic ferroelectric endowed with exceedingly complex physics related to its crystalline, amorphous, ther ...

2019

AFM contribution to unveil pro- and eukaryotic cell mechanical properties

Giovanni Dietler, Sandor Kasas, Petar Stupar

Atomic force microscopy is nowadays a well-established technique that permits the investigation of numerous parameters of living matter. In particular, it allows the exploration of the mechanical properties of living organisms in almost physiological condi ...

Elsevier2018